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128k x 8 static ram cy7c109 cy7c1009 cypress semiconductor corporation ? 3901 north first street san jose ca 95134 408-943-2600 document #: 38-05032 rev. ** revised august 24, 2001 009 features ? high speed ?t aa = 10 ns low active power ? 1017 mw (max., 12 ns) low cmos standby power ? 55 mw (max.), 4 mw (low power version) 2.0v data retention (low power version) automatic power-down when deselected ttl-compatible inputs and outputs easy memory expansion with ce 1 , ce 2 , and oe options functional description the cy7c109 / cy7c1009 is a high-performance cmos stat- ic ram organized as 131,072 words by 8 bits. easy memory expansion is provided by an active low chip enable (ce 1 ), an active high chip enable (ce 2 ), an active low output enable (oe ), and three-state drivers. writing to the device is accom- plished by taking chip enable one (ce 1 ) and write enable (we ) inputs low and chip enable two (ce 2 ) input high. data on the eight i/o pins (i/o 0 through i/o 7 ) is then written into the location specified on the address pins (a 0 through a 16 ). reading from the device is accomplished by taking chip en- able one (ce 1 ) and output enable (oe ) low while forcing write enable (we ) and chip enable two (ce 2 ) high. under these conditions, the contents of the memory location speci- fied by the address pins will appear on the i/o pins. the eight input/output pins (i/o 0 through i/o 7 ) are placed in a high-impedance state when the device is deselected (ce 1 high or ce 2 low), the outputs are disabled (oe high), or during a write operation (ce 1 low, ce 2 high, and we low). the cy7c109 is available in standard 400-mil-wide soj and 32-pin tsop type i packages. the cy7c1009 is available in a 300-mil-wide soj package. the cy7c1009 and cy7c109 are functionally equivalent in all other respects. 14 15 logic block diagram pin configurations a 1 a 2 a 3 a 4 a 5 a 6 a 7 a 8 column decoder row decoder sense amps input buffer power down we oe i/o 0 ce 2 i/o 1 i/o 2 i/o 3 512x256x8 array i/o 7 i/o 6 i/o 5 i/o 4 a 0 a 11 a 13 a 12 a a 10 ce 1 a a 16 a 9 1 2 3 4 5 6 7 8 9 10 11 14 19 20 24 23 22 21 25 28 27 26 top view soj 12 13 29 32 31 30 16 15 17 18 gnd a 16 a 14 a 12 a 7 a 6 a 5 a 4 a 3 we v cc a 15 a 13 a 8 a 9 i/o 7 i/o 6 i/o 5 i/o 4 109 ? 1 a 2 nc i/o 0 i/o 1 i/o 2 ce 1 oe a 10 i/o 3 a 1 a 0 a 11 ce 2 109 ? 2 a 6 a 7 a 16 a 14 a 12 we v cc a 4 a 13 a 8 a 9 oe tsop i top view (not to scale) 1 6 2 3 4 5 7 32 27 31 30 29 28 26 21 25 24 23 22 19 20 i/o 2 i/o 1 gnd i/o 7 i/o 4 i/o 5 i/o 6 i/o 0 ce a 11 a 5 17 18 8 9 10 11 12 13 14 15 16 ce 2 a 15 nc a 10 i/o 3 a 1 a 0 a 3 a 2 109 ? 3 selection guide 7c109-10 7c1009-10 7c109-12 7c1009-12 7c109-15 7c1009-15 7c109-20 7c1009-20 7c109-25 7c1009-25 7c109-35 7c1009-35 maximum access time (ns) 10 12 15 20 25 35 maximum operating current (ma) 195 185 155 140 135 125 maximum cmos standby current (ma) 10 10 10 10 10 10 maximum cmos standby current (ma) low power version 2 2 2 ? ? ? shaded areas contain preliminary information.
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 2 of 12 maximum ratings (above which the useful life may be impaired. for user guide- lines, not tested.) storage temperature ................................. ? 65 c to +150 c ambient temperature with power applied............................................. ? 55 c to +125 c supply voltage on v cc to relative gnd [1] .... ? 0.5v to +7.0v dc voltage applied to outputs in high z state [1] .................................... ? 0.5v to v cc + 0.5v dc input voltage [1] ................................ ? 0.5v to v cc + 0.5v current into outputs (low) .........................................20 ma static discharge voltage ........................................... >2001v (per mil-std-883, method 3015) latch-up current..................................................... >200 ma operating range range ambient temperature [2] v cc commercial 0 c to +70 c 5v 10% industrial ? 40 c to +85 c 5v 10% electrical characteristics over the operating range [3] test conditions 7c109-10 7c1009-10 7c109-12 7c1009-12 7c109-15 7c1009 ? 15 parameter description min. max. min. max. min. max. unit v oh output high voltage v cc = min., i oh = ? 4.0 ma 2.4 2.4 2.4 v v ol output low voltage v cc = min., i ol = 8.0 ma 0.4 0.4 0.4 v v ih input high voltage 2.2 v cc + 0.3 2.2 v cc + 0.3 2.2 v cc + 0.3 v v il input low voltage [1] ? 0.3 0.8 ? 0.3 0.8 ? 0.3 0.8 v i ix input load current gnd < v i < v cc ? 1 +1 ? 1+1 ? 1+1 a i oz output leakage current gnd < v i < v cc , output disabled ? 5 +5 ? 5+5 ? 5+5 a i os output short circuit current [3] v cc = max., v out = gnd ? 300 ? 300 ? 300 ma i cc v cc operating supply current v cc = max., i out = 0 ma, f = f max = 1/t rc 195 185 155 ma i sb1 automatic ce power-down current ? ttl inputs max. v cc , ce 1 > v ih or ce 2 < v il , v in > v ih or v in < v il , f = f max 45 45 40 ma i sb2 automatic ce power-down current ? cmos inputs max. v cc , ce 1 > v cc ? 0.3v, or ce 2 < 0.3v, v in > v cc ? 0.3v, or v in < 0.3v, f=0 10 10 10 ma l 222 shaded areas contain preliminary information.
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 3 of 12 electrical characteristics over the operating range (continued) 7c109-20 7c1009-20 7c109-25 7c1009-25 7c109-35 7c1009-35 parameter description test conditions min. max. min. max. min. max. unit v oh output high voltage v cc = min., i oh = ? 4.0 ma 2.4 2.4 2.4 v v ol output low voltage v cc = min., i ol = 8.0 ma 0.4 0.4 0.4 v v ih input high voltage 2.2 v cc + 0.3 2.2 v cc + 0.3 2.2 v cc + 0.3 v v il input low voltage [1] ? 0.3 0.8 ? 0.3 0.8 ? 0.3 0.8 v i ix input load current gnd < v i < v cc ? 1+1 ? 1+1 ? 1+1 a i oz output leakage current gnd < v i < v cc , output disabled ? 5+5 ? 5+5 ? 5+5 a i os output short circuit current [3] v cc = max., v out = gnd ? 300 ? 300 ? 300 ma i cc v cc operating supply current v cc = max., i out = 0 ma, f = f max = 1/t rc 140 135 125 ma i sb1 automatic ce power-down current ? ttl inputs max. v cc , ce 1 > v ih or ce 2 < v il , v in > v ih or v in < v il , f = f max 30 30 25 ma i sb2 automatic ce power-down current ? cmos inputs max. v cc , ce 1 > v cc ? 0.3v, or ce 2 < 0.3v, v in > v cc ? 0.3v, or v in < 0.3v, f=0 10 10 10 ma capacitance [4] parameter description test conditions max. unit c in input capacitance t a = 25 c, f = 1 mhz, v cc = 5.0v 9pf c out output capacitance 8 pf notes: 1. v il (min.) = ? 2.0v for pulse durations of less than 20 ns. 2. t a is the ? instant on ? case temperature. 3. not more than one output should be shorted at one time. duration of the short circuit should not exceed 30 seconds. 4. tested initially and after any design or process changes that may affect these parameters. ac test loads and waveforms 109 ? 3 109 ? 4 90% 10% 3.0v gnd 90% 10% all input pulses 5v output 30 pf including jig and scope 5v output 5 pf including jig and scope (a) (b) 3ns 3 ns output r1 480 ? r1 480 ? r2 255 ? r2 255 ? 167 ? equivalent to: venin equivalent 1.73v th
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 4 of 12 switching characteristics [3, 5] over the operating range 7c109-10 7c1009-10 7c109-12 7c1009-12 7c109-15 7c1009-15 parameter description min. max. min. max. min. max. unit read cycle t rc read cycle time 10 12 15 ns t aa address to data valid 10 12 15 ns t oha data hold from address change 3 33ns t ace ce 1 low to data valid, ce 2 high to data valid 10 12 15 ns t doe oe low to data valid 567ns t lzoe oe low to low z 0 00ns t hzoe oe high to high z [6, 7] 567ns t lzce ce 1 low to low z, ce 2 high to low z [7] 3 33ns t hzce ce 1 high to high z, ce 2 low to high z [6, 7] 567ns t pu ce 1 low to power-up, ce 2 high to power-up 0 00ns t pd ce 1 high to power-down, ce 2 low to power-down 10 12 15 ns write cycle [8,9] t wc write cycle time 10 12 15 ns t sce ce 1 low to write end, ce 2 high to write end 8 10 12 ns t aw address set-up to write end 8 10 12 ns t ha address hold from write end 0 00ns t sa address set-up to write start 0 00ns t pwe we pulse width 8 10 12 ns t sd data set-up to write end 6 78ns t hd data hold from write end 0 00ns t lzwe we high to low z [7] 3 33ns t hzwe we low to high z [6, 7] 567ns shaded areas contain preliminary information. notes: 5. test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5v, input pulse levels of 0 to 3. 0v, and output loading of the specified i ol /i oh and 30-pf load capacitance. 6. t hzoe , t hzce , and t hzwe are specified with a load capacitance of 5 pf as in part (b) of ac test loads. transition is measured 500 mv from steady-state voltage. 7. at any given temperature and voltage condition, t hzce is less than t lzce , t hzoe is less than t lzoe , and t hzwe is less than t lzwe for any given device. 8. the internal write time of the memory is defined by the overlap of ce 1 low, ce 2 high, and we low. ce 1 and we must be low and ce 2 high to initiate a write, and the transition of any of these signals can terminate the write. the input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write. 9. the minimum write cycle time for write cycle no. 3 (we controlled, oe low) is the sum of t hzwe and t sd .
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 5 of 12 switching characteristics [3, 5] over the operating range parameter description 7c109-20 7c1009-20 7c109-25 7c1009-25 7c109-35 7c1009-35 unit min. max. min. max. min. min. read cycle t rc read cycle time 20 25 35 ns t aa address to data valid 20 25 35 ns t oha data hold from address change 3 5 5 ns t ace ce 1 low to data valid, ce 2 high to data valid 20 25 35 ns t doe oe low to data valid 8 10 15 ns t lzoe oe low to low z 0 0 0 ns t hzoe oe high to high z [6, 7] 81015ns t lzce ce 1 low to low z, ce 2 high to low z [7] 355ns t hzce ce 1 high to high z, ce 2 low to high z [6, 7] 81015ns t pu ce 1 low to power-up, ce 2 high to power-up 000ns t pd ce 1 high to power-down, ce 2 low to power-down 20 25 35 ns write cycle [8] t wc write cycle time 20 25 35 ns t sce ce 1 low to write end, ce 2 high to write end152025ns t aw address set-up to write end 15 20 25 ns t ha address hold from write end 0 0 0 ns t sa address set-up to write start 0 0 0 ns t pwe we pulse width 121520ns t sd data set-up to write end 10 15 20 ns t hd data hold from write end 0 0 0 ns t lzwe we high to low z [7] 355ns t hzwe we low to high z [6, 7] 81015ns data retention characteristics over the operating range (l version only) parameter description conditions min. max unit v dr v cc for data retention no input may exceed v cc + 0.5v v cc = v dr = 2.0v, ce 1 > v cc ? 0.3v or ce 2 < 0.3v, v in > v cc ? 0.3v or v in < 0.3v 2.0 v i ccdr data retention current 50 a t cdr chip deselect to data retention time 0 ns t r operation recovery time t rc ns shaded areas contain preliminary information.
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 6 of 12 data retention waveform switching waveforms read cycle no. 1 [10, 11] read cycle no. 2 (oe controlled) [11, 12] notes: 10. device is continuously selected. oe , ce 1 = v il , ce 2 = v ih . 11. we is high for read cycle. 12. address valid prior to or coincident with ce 1 transition low and ce 2 transition high. 4.5v 4.5v ce v cc t cdr v dr > 2v data retention mode t r 109-5 previous data valid data valid t rc t aa t oha 109 ? 6 address data out 109 ? 7 50% 50% data valid t rc t ace t doe t lzoe t lzce t pu high impedance t hzoe t hzce t pd high oe ce 1 icc isb impedance address ce 2 data out v cc supply current
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 7 of 12 write cycle no. 1 (ce 1 or ce 2 controlled) [13, 14] write cycle no. 2 (we controlled, oe high during write) [13, 14] notes: 13. data i/o is high impedance if oe = v ih . 14. if ce 1 goes high or ce 2 goes low simultaneously with we going high, the output remains in a high-impedance state. switching waveforms (continued) 109 ? 8 t wc data valid t aw t sa t pwe t ha t hd t sd t sce t sce ce 1 address ce 2 we data i/o 109 ? 9 t hd t sd t pwe t sa t ha t aw t sce t sce t wc t hzoe data in valid ce 1 address ce 2 we data i/o oe note 15
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 8 of 12 write cycle no. 3 (we controlled, oe low) [14] note: 15. during this period the i/os are in the output state and input signals should not be applied. switching waveforms (continued) 109 ? 9 data valid t hd t sd t lzwe t pwe t sa t ha t aw t sce t sce t wc t hzwe ce 1 address ce 2 we data i/o note 15 truth table ce 1 ce 2 oe we i/o 0 ? i/o 7 mode power h x x x high z power-down standby (i sb ) x l x x high z power-down standby (i sb ) l h l h data out read active (i cc ) l h x l data in write active (i cc ) l h h h high z selected, outputs disabled active (i cc )
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 9 of 12 ordering information speed (ns) ordering code package name package type operating range 10 cy7c109-10vc v33 32-lead (400-mil) molded soj commercial cy7c1009-10vc v32 32-lead (300-mil) molded soj cy7c1009l-10vc v32 32-lead (300-mil) molded soj 12 cy7c109-12vc v33 32-lead (400-mil) molded soj cy7c1009-12vc v32 32-lead (300-mil) molded soj cy7c1009l-12vc v32 32-lead (300-mil) molded soj cy7c109-12zc z32 32-lead tsop type i 15 cy7c109 ? 15vc v33 32-lead (400-mil) molded soj cy7c1009-15vc v32 32-lead (300-mil) molded soj cy7c1009l-15vc v32 32-lead (300-mil) molded soj cy7c109 ? 15zc z32 32-lead tsop type i 20 cy7c109 ? 20vc v33 32-lead (400-mil) molded soj cy7c1009-20vc v32 32-lead (300-mil) molded soj cy7c109 ? 20vi v33 32-lead (400-mil) molded soj industrial cy7c109 ? 20zc z32 32-lead tsop type i commercial cy7c109-20zi z32 32-lead tsop type i industrial 25 cy7c109 ? 25vc v33 32-lead (400-mil) molded soj commercial cy7c1009-25vc v32 32-lead (300-mil) molded soj cy7c109 ? 25vi v33 32-lead (400-mil) molded soj industrial cy7c109 ? 25zc z32 32-lead tsop type i commercial cy7c109-25zi z32 32-lead tsop type i industrial 35 cy7c109 ? 35vc v33 32-lead (400-mil) molded soj commercial cy7c1009-35vc v32 32-lead (300-mil) molded soj cy7c109 ? 35vi v33 32-lead (400-mil) molded soj industrial shaded areas contain preliminary information.
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 10 of 12 package diagrams 32-lead (300-mil) molded soj v32 51-85041-a 32-lead (400-mil) molded soj v33 51-85033-a
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 11 of 12 ? cypress semiconductor corporation, 2001. the information contained herein is subject to change without notice. cypress semico nductor corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a cypress semiconductor product. nor does it convey or imply any license unde r patent or other rights. cypress semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected t o result in significant injury to the user. the inclusion of cypress semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in do i ng so indemnifies cypress semiconductor against all charges. package diagrams (continued) 51-85056-b 32-lead thin small outline package z32
cy7c109 cy7c1009 document #: 38-05032 rev. ** page 12 of 12 document title: cy7c109, cy7c1009 128k x 8 static ram document number: 38-05032 rev. ecn no. issue date orig. of change description of change ** 106826 09/15/01 szv change from spec number: 38-00140 to 38-05032

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